The Wafer's Journey
Follow Wafer #8847 as a quartz focus ring erodes at 0.3nm per RF hour. Every individual sensor reading is within spec. The process is failing anyway. Master CUSUM through the failure mode that threshold-based monitoring cannot see.
The Memory Problem
Wafer #8847 is the 1,847th wafer processed in Chamber 12 since the last preventive maintenance cycle. The quartz focus ring has been eroding at 0.3nm per RF hour for weeks. Each individual wafer is fine. Each individual sensor reading is within its control limits. A Shewhart chart shows green on every parameter. But something is accumulating. The etch depth on edge dies has shifted by 1.4nm over the last 200 wafers. By wafer 8847, it will be 2.1nm. The device spec is 2.5nm. There are 400 wafers left in the queue.
CUSUM does not care what caused the drift. It cares that the process is consistently trending away from its target. The physics investigation is the engineer's job. CUSUM's job is to tell them when to start.
Continue the journey
Zones 01 through 04 cover the problem scenario, algorithm analysis, alternative comparisons, interview gauntlet, and production checklist for this journey.
All six journeys are included with full access.