The Wafer's Journey
Follow Lot #0190 through a $1.6M process optimization decision. The etch team wants to test five recipe parameters. The full factorial costs $1.6M. A fractional factorial costs $400K. Master Design of Experiments through the one methodology that separates a data scientist from a data analyst in a fab.
The OFAT Trap
The etch team has been optimizing their recipe for six weeks. Their method: change RF power while holding everything else constant, find the best setting, then change pressure while holding RF power at its new value, then change gas flow. One Factor At a Time. It is intuitive. It is systematic. It is wrong. OFAT misses interaction effects: the combination where high RF power and low pressure together produce a result neither factor achieves alone. In semiconductor etch, interaction effects are not noise. They are frequently the dominant signal. Lot #0190 is the first lot in a properly designed experiment.
The fractional factorial is not an approximation of the full factorial. It is a deliberate information-theoretic choice: you trade knowledge of certain high-order interactions (which are rarely significant in physical processes) for a 50-75% reduction in experimental cost.
Continue the journey
Zones 01 through 04 cover the problem scenario, algorithm analysis, alternative comparisons, interview gauntlet, and production checklist for this journey.
All six journeys are included with full access.